MAT SCI 110
Introduction to Materials Characterization A (Crystal Structure, Nanostructures, and X-Ray Scattering)
Materials Science and Engineering · 4 units · Undergraduate upper division (100-199)
Modern methods of materials characterization; fundamentals of crystallography, properties of X rays, X-ray scattering; powder method, Laue method; determination of crystal structures; phase diagram determination; high-resolution X-ray diffraction methods; X-ray spectroscopy; design of materials characterization procedures.
Letter grading.
Requisites
Official UCLA wording
Enforced requisite: course 104.
BruinTree reads · Prerequisite
confidence 1.00 · from textRequires
Everything that has to come before this course, not just the courses named in the requisite above.
MAT SCI 110
- MAT SCI 104Science of Engineering Materials
- CHEM 20AChemical Structure
- PHYSICS 1APhysics for Scientists and Engineers: Mechanics
1 direct requisite. Showing 23 courses over 3 levels; the branches marked with a count carry on past it. Every course here opens its own tree.
Unlocks
What this course is a requisite for, and what those courses lead to in turn.
MAT SCI 110
- MAT SCI 120Physics of Materials
- MAT SCI 121Materials Science of Semiconductors
- MAT SCI 121LMaterials Science of Semiconductors Laboratory
- MAT SCI 200Principles of Materials Science I
- MAT SCI 226Si-CMOS Technology: Selected Topics in Materials Science